Sparčiųjų skaitmeninių integrinių grandynų ir informacijos keitiklių dinaminių parametrų testavimas

Rokas Kvedaras, Vygaudas Kvedaras

Study book (in Lithuanian)

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Description

The book is intended for M. Sc. Students of Electronic Engineering in Vilnius Gediminas Technical University who are studying module Testing of Electronic Systems (ELESM03701) and (ELESM03702). The material that is presented may also be of value engineers practitioners. The book contains information on problems of measurement of dynamic parameters of high-speed Integrated Digital Circuits and digital-to-analogue and analogue-to-digital converters (ADCs and DACs).

Testing of Electronic systems is an important problem that needs to be solved during process of manufacturing of such systems in order to ensure quality and reliability of such systems. In electronics practise digital integrated circuits and analogue-to-digital and digital-to-analogue converters are widely used in recent time. Problems of testing of such systems are rather complex and requires special methods and equipment.

Electronic version of the book:

DOI: https://doi.org/10.3846/1218-S

Product Details

Data sheet

Year:
2011
ISBN:
978-9955-28-921-0
eISBN:
978-9955-28-919-7
Imprint No:
1218-S
Dimensions:
145×205 mm
Pages:
116 p.
Cover:
Softcover
Language:
Lithuanian
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